Performs good/bad test for transistors, FETs, and SCRs. Meter also identifies NPN or PNP for transistors, N-channel or P-channel for FET, FET-gate lead, all leads of transistors in LO drive, base lead in HI drive, and all leads of SCR. It uses a patented limited-energy pulse circuit, which provides highly successful in-circuit testing in the presence of low shunt impedances with complete safety for the device under test. Instrument is designed for a minimum amount of control manipulation, allowing for rapid testing of most devices. Unit requires four AA batteries (not included), and comes with color-coded test leads and carrying case.

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